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Labels

Labels

Ultra High Speed Label Analysis

Highlights

Label detection and analysis at a linear speed of over 4 m/sec

Technology Components

  • Bi-i V2 or V301
  • Bi-i Software Developer Kit
  • Signal and Image Processing Library (SI Lib) of the InstantVision ISE
  • Feature Classification Library (FC Lib) of the InstantVision ISE

Application Area

Texture Analysis

Description

In this application demo prototype full and independent visual inspection is carried out on each label separately while the roll of labels is moving at a continuous speed of up to 4 m/s.

Detailed and complex analysis of every label (while accounting for various distortions) is carried out using AnaLogic/Eutecus’ Cellular Visual Technology (CVT).

The system robustly detects dirt spots and patches, weaving faults, missing, warped or torn fibers, and errors in the patterns on the label. The complete application developed with the Bi-i Software Developer Kit and the InstantVision libraries runs on the standalone Bi-i platform. Once a fault is detected and identified, its basic information is transmitted to a host computer, which can make the necessary interventions in the manufacturing process.

Status

Ready (similar solutions under development)

Videos

"LABELS" demonstration video
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